Residual stress relaxation in GaN/sapphire circular pillars measured by Raman scattering spectroscopy
| Autor: | Margueron, Samuel H. a, ⁎, Bourson, Patrice a, Gautier, Simon a, Soltani, Ali b, Troadec, David b, De Jaeger, Jean-Claude b, Sirenko, Andrei A. c, Ougazzaden, Abdallah d |
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| Zdroj: | In Journal of Crystal Growth 2008 310(24):5321-5326 |
| Databáze: | ScienceDirect |
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