Crystallographic properties of grain size-controlled polycrystalline silicon thin films deposited on alumina substrate

Autor: Ogane, Akiyoshi, Honda, Shinya, Uraoka, Yukiharu, Fuyuki, Takashi, Fejfar, Antonín, Kočka, Jan
Zdroj: In Journal of Crystal Growth 2009 311(3):789-793
Databáze: ScienceDirect