Structural characterization of non-polar (1 1 2 0) and semi-polar (1 1 2 6) GaN films grown on r-plane sapphire
| Autor: | Zhou, Lin, Chandrasekaran, R., Moustakas, T.D., Smith, David J. |
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| Zdroj: | In Journal of Crystal Growth 2008 310(12):2981-2986 |
| Databáze: | ScienceDirect |
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