Structural characterization of TiO 2 films grown on LaAlO 3 and SrTiO 3 substrates using reactive molecular beam epitaxy

Autor: Weng, X., Fisher, P., Skowronski, M., Salvador, P.A., Maksimov, O.
Zdroj: In Journal of Crystal Growth 2008 310(3):545-550
Databáze: ScienceDirect