Characteristics of the improved a-plane GaN films grown on r-plane sapphire with two-step AlN buffer layer

Autor: Yan, J.F., Guo, L.W., Zhang, J., Zhu, X.L., Ding, G.J., Xing, Z.G., Zhou, Z.T., Pei, X.J., Wang, Y., Jia, H.Q., Chen, H., Zhou, J.M.
Zdroj: In Journal of Crystal Growth 2007 307(1):35-39
Databáze: ScienceDirect