Impurity effects in ZnO and nitrogen-doped ZnO thin films fabricated by MOCVD
Autor: | Li, Xiaonan, Asher, Sally E., Limpijumnong, Sukit, Keyes, Brian M., Perkins, Craig L., Barnes, Teresa M., Moutinho, Helio R., Luther, Joseph M., Zhang, S.B., Wei, Su-Huai, Coutts, Timothy J. |
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Zdroj: | In Journal of Crystal Growth 2006 287(1):94-100 |
Databáze: | ScienceDirect |
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