Impurity effects in ZnO and nitrogen-doped ZnO thin films fabricated by MOCVD

Autor: Li, Xiaonan, Asher, Sally E., Limpijumnong, Sukit, Keyes, Brian M., Perkins, Craig L., Barnes, Teresa M., Moutinho, Helio R., Luther, Joseph M., Zhang, S.B., Wei, Su-Huai, Coutts, Timothy J.
Zdroj: In Journal of Crystal Growth 2006 287(1):94-100
Databáze: ScienceDirect