X-ray diffraction residual stress calculation on textured La2/3Sr1/3MnO3 thin film
| Autor: | Meda, Lamartine, Dahmen, Klaus H., Hayek, Saleh, Garmestani, Hamid * |
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| Zdroj: | In Journal of Crystal Growth 1 March 2004 263(1-4):185-191 |
| Databáze: | ScienceDirect |
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