Structural characterization of epitaxial Cd 1− xZn xTe semiconductor thin films by ion beam techniques
| Autor: | Fernández-Lima, F., Larramendi, E.M., Purón, E., Pedrero, E., de Melo, O., Baptista, D.L., Zawislak, F.C. * |
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| Zdroj: | In Journal of Crystal Growth 2003 253(1):89-94 |
| Databáze: | ScienceDirect |
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