Formation of thin GaN layer on Si (1 1 1) for fabrication of high-temperature metal field effect transistors (MESFETs)

Autor: Yoshida, Seikoh *, Li, Jiang, Takehara, Hironari, Wada, Takahiro
Zdroj: In Journal of Crystal Growth 2003 253(1):85-88
Databáze: ScienceDirect