Influence of low-temperature interlayers on strain and defect density of epitaxial GaN layers
| Autor: | Rossow, U. *, Hitzel, F., Riedel, N., Lahmann, S., Bläsing, J., Krost, A., Ade, G., Hinze, P., Hangleiter, A. |
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| Zdroj: | In Journal of Crystal Growth 2003 248:528-532 |
| Databáze: | ScienceDirect |
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