X-ray diffraction and FTIR spectroscopy of heat treated R 2O 3:3Ga 2O 3:4B 2O 3 systems

Autor: Beregi, E. *, Watterich, A., Madarász, J., Tóth, M., Polgár, K.
Zdroj: In Journal of Crystal Growth 2002 237 Part 1:874-878
Databáze: ScienceDirect