Effects of stress on the microstructure of the corner defect in As +-implanted, two-dimensional amorphized Si
| Autor: | Shin, Yu Gyun, Lee, Jeong Yong *, Park, Moon Han, Kang, Ho Kyu |
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| Zdroj: | In Journal of Crystal Growth 2001 233(4):673-680 |
| Databáze: | ScienceDirect |
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