Investigation of metal–GaN and metal–AlGaN contacts by XPS depth profiles and by electrical measurements
| Autor: | Dumont, J. *, Monroy, E., Muñoz, E., Caudano, R., Sporken, R. |
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| Zdroj: | In Journal of Crystal Growth 2001 230(3):558-563 |
| Databáze: | ScienceDirect |
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