Nearly strain-free AlGaN on (0 0 0 1) sapphire: X-ray measurements and a new crystallographic growth model
| Autor: | Krost, A. *, Bläsing, J., Schulze, F., Schön, O., Alam, A., Heuken, M. |
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| Zdroj: | In Journal of Crystal Growth 2000 221(1):251-257 |
| Databáze: | ScienceDirect |
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