Study on the distribution of binary mixed counterions in surfactant adsorbed films by total reflection XAFS measurements

Autor: Imai, Y., Li, H.H., Takumi, H., Tanida, H., Watanabe, I., Takiue, T., Matsubara, H., Aratono, M.
Zdroj: In Journal of Colloid And Interface Science 15 December 2012 388(1):219-224
Databáze: ScienceDirect