Wettability of nanoengineered dual-roughness surfaces fabricated by UV-assisted capillary force lithography
| Autor: | Jeong, Hoon Eui, Kwak, Moon Kyu, Park, Chan Ick, Suh, Kahp Yang |
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| Zdroj: | In Journal of Colloid And Interface Science 2009 339(1):202-207 |
| Databáze: | ScienceDirect |
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