Full-field identification of mixed-mode adhesion properties in a flexible, multi-layer microelectronic material system
| Autor: | Ruybalid, A.P., van der Sluis, O., Geers, M.G.D., Hoefnagels, J.P.M. |
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| Zdroj: | In Engineering Fracture Mechanics 1 March 2020 226 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect