In situ electrochemical impedance spectroscopy/synchrotron radiation grazing incidence X-ray diffraction—A powerful new technique for the characterization of electrochemical surfaces and interfaces
| Autor: | De Marco, Roland, Jiang, Zhong-Tao, Martizano, Jay, Lowe, Alex, Pejcic, Bobby, van Riessen, Arie |
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| Zdroj: | In Electrochimica Acta 2006 51(26):5920-5925 |
| Databáze: | ScienceDirect |
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