Temperature sensitivity analysis of inner-gate engineered JL-SiNT-FET: An Analog/RF prospective
| Autor: | Tayal, Shubham, Mittal, Vikas, Jadav, Sunil, Gupta, Shikhar, Nandi, Ashutosh, Krishan, Bal |
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| Zdroj: | In Cryogenics June 2020 108 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect