Spatial distribution of the local resistive transition and the critical current density in YBCO coated conductors using Low-temperature Scanning Laser Microscopy
| Autor: | Park, S.K., Kim, J.M., Lee, S.B., Kim, S.H., Kim, G.Y., Ri, H.-C. |
|---|---|
| Zdroj: | In Cryogenics 2011 51(6):241-246 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect