Cryogenic transistor measurement and modeling for engineering applications
| Autor: | Goryachev, Maxim, Galliou, Serge, Abbé, Philippe |
|---|---|
| Zdroj: | In Cryogenics 2010 50(6):381-389 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Goryachev, Maxim, Galliou, Serge, Abbé, Philippe |
|---|---|
| Zdroj: | In Cryogenics 2010 50(6):381-389 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect