RHEED intensities from two-dimensional heteroepitaxial nanoscale systems of GaN on AlN(0 0 0 1) and AlN(0 0 0 [formula omitted]) surfaces
Autor: | Daniluk, Andrzej |
---|---|
Zdroj: | In Computer Physics Communications November 2019 244:487-489 |
Databáze: | ScienceDirect |
Externí odkaz: |