Structure of ultra-thin silicon film on HOPG studied by polarization-dependence of X-ray absorption fine structure
| Autor: | Baba, Y., Shimoyama, I., Hirao, N., Sekiguchi, T. |
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| Zdroj: | In Chemical Physics Letters 20 February 2014 594:64-68 |
| Databáze: | ScienceDirect |
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