In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus [formula omitted] atmosphere
| Autor: | Hosokai, T., Hinderhofer, A., Vorobiev, A., Lorch, C., Watanabe, T., Koganezawa, T., Gerlach, A., Yoshimoto, N., Kubozono, Y., Schreiber, F. |
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| Zdroj: | In Chemical Physics Letters 20 August 2012 544:34-38 |
| Databáze: | ScienceDirect |
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