Bonding structure and dry etching characteristics in amorphous B–C–N films for hardmask applications

Autor: Kim, Hongik, Kim, Unggi, Hong, Deokgi, Kim, Sungtae, Han, Seungwu, Joo, Young-Chang, Lee, So-Yeon
Zdroj: In Carbon June 2024 226
Databáze: ScienceDirect