On the nature of defects created on graphene by scanning probe lithography under ambient conditions
| Autor: | Chien, Hsiao-Mei, Chuang, Min-Chiang, Tsai, Hung-Chieh, Shiu, Hung-Wei, Chang, Lo-Yueh, Chen, Chia-Hao, Lee, Sheng-Wei, White, Jonathon David, Woon, Wei-Yen |
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| Zdroj: | In Carbon December 2014 80:318-324 |
| Databáze: | ScienceDirect |
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