Electronic and structural properties of graphene-based metal-semiconducting heterostructures engineered by silicon intercalation

Autor: Silly, M.G., D’Angelo, M., Besson, A., Dappe, Y.J., Kubsky, S., Li, G., Nicolas, F., Pierucci, D., Thomasset, M.
Zdroj: In Carbon September 2014 76:27-39
Databáze: ScienceDirect