Electronic and structural properties of graphene-based metal-semiconducting heterostructures engineered by silicon intercalation
Autor: | Silly, M.G., D’Angelo, M., Besson, A., Dappe, Y.J., Kubsky, S., Li, G., Nicolas, F., Pierucci, D., Thomasset, M. |
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Zdroj: | In Carbon September 2014 76:27-39 |
Databáze: | ScienceDirect |
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