AFM study of ridges in few-layer epitaxial graphene grown on the carbon-face of 4H–SiC[formula omitted]
| Autor: | Prakash, Gyan, Capano, Michael A., Bolen, Michael L., Zemlyanov, Dmitry, Reifenberger, Ronald G. |
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| Zdroj: | In Carbon August 2010 48(9):2383-2393 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect