Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+–Ar+ cosputtering
| Autor: | Liao, Hua-Yang, Tsai, Meng-Hung, Kao, Wei-Lun, Kuo, Ding-Yuan, Shyue, Jing-Jong |
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| Zdroj: | In Analytica Chimica Acta 10 December 2014 852:129-136 |
| Databáze: | ScienceDirect |
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