Chapter 6 - Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions
| Autor: | Etzler, Frank M., Drelich, Jaroslaw |
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| Zdroj: | In Developments in Surface Contamination and Cleaning - Detection, Characterization, and Analysis of Contaminants 2012:307-331 |
| Databáze: | ScienceDirect |
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