Characterization of lattice-matched and strained GaInAs/AlInAs HEMT structures by photoluminescence spectroscopy
Autor: | Tabata, A., Benyattou, T., Guillot, G., Georgakilas, A., Zekentes, K., Halkias, G. |
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Zdroj: | In Semiconductor Materials Analysis and Fabrication Process Control 1993:182-186 |
Databáze: | ScienceDirect |
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