Chapter 15 - Analytical modeling of nanoscale advance devices and their reliability aspects
| Autor: | Das, Sanghamitra, Dash, Taraprasanna, Baral, Biswajit, Biswal, Sudhansu Mohan, Jena, Devika, Mohapatra, Eleena |
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| Zdroj: | In Nanoelectronics: Physics, Materials, and Devices 2023:385-408 |
| Databáze: | ScienceDirect |
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