8 - Point defects in stoichiometric and nonstoichiometric metal oxides for modern microelectronics
| Autor: | Kolkovsky, Vladimir, Stübner, Ronald |
|---|---|
| Zdroj: | In Metal Oxide Defects 2023:217-252 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Kolkovsky, Vladimir, Stübner, Ronald |
|---|---|
| Zdroj: | In Metal Oxide Defects 2023:217-252 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|