A pattern-deviation photon scanning technique for precise measurement of internal component locations
| Autor: | Dunn, William L., van Haaren, Michael H., Yacout, Abdelfatah M. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, A 1994 353(1):658-662 |
| Databáze: | ScienceDirect |
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