A novel technique for the simultaneous measurement of ambipolar carrier lifetime and diffusion coefficient in silicon
| Autor: | Rosling, Mats, Bleichner, Henry, Lundqvist, Måns, Nordlander, Edvard |
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| Zdroj: | In Solid State Electronics 1992 35(9):1223-1227 |
| Databáze: | ScienceDirect |
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