An exponential SRGM with a bound on the number of failures
Autor: | Kapur, P.K., Bhushan, Shakti, Younes, Said |
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Zdroj: | In Microelectronics Reliability 1993 33(9):1245-1249 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Kapur, P.K., Bhushan, Shakti, Younes, Said |
---|---|
Zdroj: | In Microelectronics Reliability 1993 33(9):1245-1249 |
Databáze: | ScienceDirect |
Externí odkaz: |