The Burr Type II distribution: Properties, order statistics
| Autor: | Ragab, Aisha, Green, Jack R., Tweedie, M.C.K. |
|---|---|
| Zdroj: | In Microelectronics Reliability 1991 31(6):1181-1191 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Ragab, Aisha, Green, Jack R., Tweedie, M.C.K. |
|---|---|
| Zdroj: | In Microelectronics Reliability 1991 31(6):1181-1191 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|