Degradation of electrical contacts caused by oscillatory micromotion between the contact members : Helge Kongsjorden, John Kulsetås and Jarle Sletbak. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-2, (1) 32 (March 1979)

Zdroj:	In Microelectronics Reliability 1979 19(5):410-410
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu