Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices

Autor:	Juraj Marek, Gregor Pobegen, Ulrike Grossner
Předmět:	Chemical engineering, Chemistry, Electrical engineering, Engineering, Mechanical engineering, Physics
Kategorie:	TECHNOLOGY & ENGINEERING / Electronics / General, TECHNOLOGY & ENGINEERING / Mechanical, TECHNOLOGY & ENGINEERING / Materials Science / General
Popis:	Special topic volume with invited peer-reviewed papers only
Databáze:	eBook Index
Externí odkaz:	Zobrazit plný text záznamu