| Autor: |
Ho Y. Kim, Vijay Harid, Alexander Mroz, Joshua Wewerka, Dalibor J. Todorovski, Mark Golkowski, Ronald A. L. Rorrer, Morris B. Cohen, Nathan M. Opalinski |
| Jazyk: |
angličtina |
| Rok vydání: |
2020 |
| Předmět: |
|
| Zdroj: |
IEEE Access, Vol 8, Pp 79745-79753 (2020) |
| Druh dokumentu: |
article |
| ISSN: |
2169-3536 |
| DOI: |
10.1109/ACCESS.2020.2990403 |
| Popis: |
Imaging through conductive media is a pervasive problem in medical, industrial, and security applications. Several potential modalities such as X-ray, exotic particle beams, and related high resolution techniques have been employed in the past. However, the difficulty of production and safety of these technologies is a concern in practice. Of particular interest in this work are extremely and very low frequency (ELF/VLF, f |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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