| Autor: |
Felix Lüpke, Markus Eschbach, Tristan Heider, Martin Lanius, Peter Schüffelgen, Daniel Rosenbach, Nils von den Driesch, Vasily Cherepanov, Gregor Mussler, Lukasz Plucinski, Detlev Grützmacher, Claus M. Schneider, Bert Voigtländer |
| Jazyk: |
angličtina |
| Rok vydání: |
2017 |
| Předmět: |
|
| Zdroj: |
Nature Communications, Vol 8, Iss 1, Pp 1-7 (2017) |
| Druh dokumentu: |
article |
| ISSN: |
2041-1723 |
| DOI: |
10.1038/ncomms15704 |
| Popis: |
Exploiting topological insulator surface states in electronic devices requires an understanding of the factors that affect transport. Here, the authors use scanning tunnelling potentiometry to determine the contributions of different kinds of surface defects to the electrical resistance. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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