Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy

Autor: Mabel Ruiz-Lopez, Masoud Mehrjoo, Barbara Keitel, Elke Plönjes, Domenico Alj, Guillaume Dovillaire, Lu Li, Philippe Zeitoun
Jazyk: angličtina
Rok vydání: 2020
Předmět:
Zdroj: Sensors, Vol 20, Iss 22, p 6426 (2020)
Druh dokumentu: article
ISSN: 1424-8220
DOI: 10.3390/s20226426
Popis: Wavefront analysis is a fast and reliable technique for the alignment and characterization of optics in the visible, but also in the extreme ultraviolet (EUV) and X-ray regions. However, the technique poses a number of challenges when used for optical systems with numerical apertures (NA) > 0.1. A high-numerical-aperture Hartmann wavefront sensor was employed at the free electron laser FLASH for the characterization of a Schwarzschild objective. These are widely used in EUV to achieve very small foci, particularly for photolithography. For this purpose, Schwarzschild objectives require highly precise alignment. The phase measurements acquired with the wavefront sensor were analyzed employing two different methods, namely, the classical calculation of centroid positions and Fourier demodulation. Results from both approaches agree in terms of wavefront maps with negligible degree of discrepancy.
Databáze: Directory of Open Access Journals
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