Statistical and Fractal Analysis of Random Height Function

Autor:	Stanislav Jurecka, Maria Jureckova
Jazyk:	angličtina
Rok vydání:	2017
Předmět:	multifractal analysis statistical methods semiconductor structures Transportation and communications HE1-9990 Science Transportation engineering TA1001-1280
Zdroj:	Communications, Vol 19, Iss 3, Pp 57-61 (2017)
Druh dokumentu:	article
ISSN:	1335-4205 2585-7878
DOI:	10.26552/com.C.2017.3.57-61
Popis:	Nanostructured semiconductor surfaces are commonly used for suppression of the light reflection. We prepared several kinds of surface structures on silicon substrate and analyzed the properties of the random height function used for the description of observed surface morphology. Statistical and fractal methods used in this analysis provide useful information for the optimization of the surface forming procedure. Multifractal analysis provides additional information about the surface morphology, not contained in the results of standard statistical methods. Numerical procedures used in the multifractal analysis were tested by using theoretical random height function created from large sets of Cantor numbers.
Databáze:	Directory of Open Access Journals
Externí odkaz:	https://doaj.org/article/faed6bb8a0aa43d0907716ec9c25ce1f Zobrazit plný text záznamu View record in DOAJ