| Autor: |
G Mercurio, I A Makhotkin, I Milov, Y Y Kim, I A Zaluzhnyy, S Dziarzhytski, L Wenthaus, I A Vartanyants, W Wurth |
| Jazyk: |
angličtina |
| Rok vydání: |
2019 |
| Předmět: |
|
| Zdroj: |
New Journal of Physics, Vol 21, Iss 3, p 033031 (2019) |
| Druh dokumentu: |
article |
| ISSN: |
1367-2630 |
| DOI: |
10.1088/1367-2630/aafa47 |
| Popis: |
We demonstrate the structural sensitivity and accuracy of the x-ray standing wave technique at a high repetition rate free-electron laser, FLASH at DESY in Hamburg, by measuring the photoelectron yield from the surface SiO _2 of Mo/Si multilayers. These experiments open up the possibility to obtain unprecedented structural information of adsorbate and surface atoms with picometer spatial and femtosecond temporal resolution. This technique will substantially contribute to a fundamental understanding of chemical reactions at catalytic surfaces and the structural dynamics of superconductors. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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