RESEARCH PROGRESS ON CUTTING TECHNOLOGY OF SIC MONO-CRYSTAL WAFER WITH WIRE SAW

Autor: LI Lun, LI ShuJuan, TANG AoFei, LI Yan
Jazyk: čínština
Rok vydání: 2015
Předmět:
Zdroj: Jixie qiangdu, Vol 37, Pp 849-856 (2015)
Druh dokumentu: article
ISSN: 1001-9669
DOI: 10.16579/j.issn.1001.9669.2015.05.004
Popis: Having a unique physical characteristics and stable semiconductor properties,silicon carbide( Si C) monocrystal wafer has been widely used in integrated circuits,space optics and other fields.In manufacturing process of Si C monocrystal wafer,cutting is primary key process,which the cutting costs accounts for more than 50% of the whole wafer processing costs.In this paper,the datum and relevant literature of domestic and foreign were reviewed to,the current research status of Si C cutting technology,especially cutting with wire saw,and cutting equipment were studied.Moreover,the existing problems in Si C cut by wire saw and in cutting equipment was analyzed.It is proposed that the future researching direction of Si C wafer cutting technology by wire saw.
Databáze: Directory of Open Access Journals