Autor: |
Rommel B. Viana, Albérico B. F. da Silva, André S. Pimentel |
Jazyk: |
angličtina |
Rok vydání: |
2012 |
Předmět: |
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Zdroj: |
International Journal of Molecular Sciences, Vol 13, Iss 7, Pp 7980-7993 (2012) |
Druh dokumentu: |
article |
ISSN: |
1422-0067 |
DOI: |
10.3390/ijms13077980 |
Popis: |
This paper describes the adsorption of sodium dodecyl sulfate (SDS) molecules in a low polar solvent on Ge substrate by using Fourier transform infrared-attenuated total reflection (FTIR-ATR) spectroscopy and atomic force microscopy (AFM). The maximum SDS amount adsorbed is (5.0 ± 0.3) × 1014 molecules cm−2 in CHCl3, while with the use of CCl4 as subphase the ability of SDS adsorbed is 48% lower. AFM images show that depositions are highly disordered over the interface, and it was possible to establish that the size of the SDS deposition is around 30–40 nm over the Ge surface. A complete description of the infrared spectroscopic bands for the head and tail groups in the SDS molecule is also provided. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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