Autor: |
Laura Wollesen, Paul-Antoine Douissard, Philip Cook, Pavel Loiko, Gurvan Brasse, Jérémie Margueritat, Patrice Camy, Thierry Martin, Christophe Dujardin |
Jazyk: |
angličtina |
Rok vydání: |
2024 |
Předmět: |
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Zdroj: |
Optical Materials: X, Vol 22, Iss , Pp 100309- (2024) |
Druh dokumentu: |
article |
ISSN: |
2590-1478 |
DOI: |
10.1016/j.omx.2024.100309 |
Popis: |
Scintillators are X-ray to visible light converters applied in X-ray imaging detectors used at synchrotrons. Drastically improved performances of the 4th generation synchrotron sources enable us to perform X-ray imaging experiments at higher energies. For high spatial resolution X-ray imaging (micrometer to submicrometer), thin scintillating films are required. Consequently, especially for high X-ray energies (30keV to 100keV), the detection efficiency is limited due to the low X-ray absorption efficiency of the thin films. We have used Liquid Phase Epitaxy (LPE) to grow thin films of one of the ultimate high-density materials, Lu2Hf2O7:Eu3+, which demonstrate scintillating properties and thus combine high spatial resolution and maximized absorption efficiency. X-ray imaging experiments demonstrate that the Modulation Transfer Function (MTF) reaches 10% at 900 lp/mm, and radiographs visually confirm the promising imaging properties. We present structural, luminescent, and scintillation characterization of Lu2Hf2O7:Eu thin films grown on ZrO2:Y substrates, showing that the films crystallize in the disordered fluorite structure and the europium ions incorporate into the structure and enhance the luminescence intensity. This contribution is a first step toward developing promising ultra-dense, hafnate-based scintillating screens for high spatial resolution X-ray imaging. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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