| Autor: |
Geml Fabian, Gapp Benjamin, Johnson Simon, Sutton Patricia, Goode Angela, Booth Jonathan, Plagwitz Heiko, Hahn Giso |
| Jazyk: |
angličtina |
| Rok vydání: |
2023 |
| Předmět: |
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| Zdroj: |
EPJ Photovoltaics, Vol 14, p 8 (2023) |
| Druh dokumentu: |
article |
| ISSN: |
2105-0716 |
| DOI: |
10.1051/epjpv/2022034 |
| Popis: |
Silver (Ag) pastes are widely used in the global market for most solar cell architectures. Thereby, lead (Pb) is no longer wanted in productions for environmental reasons. In this work, a model for the contact formation between Pb-free, tellurium oxide (TeO2) containing screen-printable Ag pastes and silicon is presented. It is shown that Te plays a key role in this model. Te is not only an important part in etching the surface passivation layers with TeO2 dissolving the dielectric layer but also for a formation of the contacts with Te forming a compound consisting of Ag2Te. Using EDX mapping, local contact regions can be examined and interpreted for contact formation. The used paste system enables far more flexible paste mixturing leading to a novel developed commercial paste which is on a par with other pastes used in industry concerning the resulting contact properties. This is also demonstrated in this work by the very low contact resistivity of less than 1 mΩcm2 over a wide range of firing peak temperatures. It is additionally shown that good resistivities can be achieved on both n+- and p+-doped regions. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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