| Autor: |
A. F. Pedersen, V. Chamard, C. Detlefs, T. Zhou, D. Carbone, H. F. Poulsen |
| Jazyk: |
angličtina |
| Rok vydání: |
2020 |
| Předmět: |
|
| Zdroj: |
Physical Review Research, Vol 2, Iss 3, p 033031 (2020) |
| Druh dokumentu: |
article |
| ISSN: |
2643-1564 |
| DOI: |
10.1103/PhysRevResearch.2.033031 |
| Popis: |
We demonstrate an x-ray coherent imaging method that combines high spatial resolution with the ability to map grains within thick polycrystalline specimens. An x-ray objective serves to isolate an embedded grain. Iterative oversampling routines and Fourier synthesis are used to reconstruct the shape and strain field from the far-field intensity pattern. In a demonstration experiment a ∼500-nm Pt grain embedded in a polycrystalline Pt matrix is mapped in three dimensions without compromising the spatial resolution. No information on the pupil function of the lens is required and lens aberrations are not critical. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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