Filtering of Defects in Semipolar (11−22) GaN Using 2-Steps Lateral Epitaxial Overgrowth

Autor: Kriouche N, Leroux M, Vennéguès P, Nemoz M, Nataf G, de Mierry P
Jazyk: angličtina
Rok vydání: 2010
Předmět:
Zdroj: Nanoscale Research Letters, Vol 5, Iss 12, Pp 1878-1881 (2010)
Druh dokumentu: article
ISSN: 1931-7573
1556-276X
DOI: 10.1007/s11671-010-9724-9
Popis: Abstract Good-quality (11−22) semipolar GaN sample was obtained using epitaxial lateral overgrowth. The growth conditions were chosen to enhance the growth rate along the [0001] inclined direction. Thus, the coalescence boundaries stop the propagation of basal stacking faults. The faults filtering and the improvement of the crystalline quality were attested by transmission electron microscopy and low temperature photoluminescence. The temperature dependence of the luminescence polarization under normal incidence was also studied.
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